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    VIT News - August 2010 July 2010
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Vi TECHNOLOGY Meet Vi TECHNOLOGY at Nepcon Shenzhen
VIT News - August 2010
 
Vi TECHNOLOGY

Editorial


Nepcon South China, at Shenzhen, is a major event for Vi TECHNOLOGY, an opportunity we do not want to miss. For this show, we are working closely with our Chinese Agents, providing them with our latest equipment & technologies to promote in their exhibits.
VIT's executive management will be at Nepcon Shenzhen as it is an ideal occasion to make contact with our Agents and Customers, and for mid-year updates. It is vital we meet our Partners actively listen to them & understand their exact needs; then provide the right solutions. This approach is the foundation to create value for our customers. See you at Shenzhen.


 


Vi TECHNOLOGY's AOI, Pin Through Hole inspection capability


Vi TECHNOLOGY's AOI, Pin Through Hole inspection capability Saint Egreve, France 2010, July 12th -  Vi TECHNOLOGY's  AOI, Pin Through Hole inspection capability Surface Mount Technology (SMT) has widely replaced Through Hole Technology (THT), allowing...

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Technologies
Selective 3D AOI
Vi TECHNOLOGY® Selective 3D technology paves the way to 3-dimensional AOI. This feature allows detection of coplanarity defects on surface mount components and makes multiple camera systems unnecessary. This...

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2K Series

2K Series
A compact, high speed and affordable AOI solution The 2K Series is an inspection and process control solution enabling a 100% defect detection including presence, absence, polarity, placement accuracy, OCV...
2K Series

 
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